GB/T 16304-1996 Test method for electric field-strain characteristics of piezoelectric ceramics

This standard specifies the test method for static strain and dynamic strain of piezoelectric ceramics under external electric field. This standard is applicable to the measurement of piezoelectric ceramic field-strain curve, and can calculate the deformation of piezoelectric ceramics under unit electric field through the strain curve. GB/T 16304-1996 Test method for electric field-strain characteristics of piezoelectric ceramics GB/T16304-1996 Standard download decompression password: www.bzxz.net

ICS 31.140
National Standard of the People's Republic of China
GB/T16304-.1996
Test methods of the properties of. the relation betweenstrain and electric field for piezoelectric ceramic1996-04-25Promulgated
National Technical Supervision Bureau
1997-01-01Implementation
National Standard of the People's Republic of China
Test methods or the propertylea or the relation betweenstrain and electric field for piezoelectric ceramic1 Main content and applicable diagrams
GB/T 16304-1996
This standard specifies the test method for static strain and dynamic strain of piezoelectric ceramics under external electric field. This standard is used to measure the field-strain curve of piezoelectric ceramics, and the strain curve can be used to calculate the strain of piezoelectric ceramics under unit electric field.
2 Referenced standards
GB3389.182E Test methods for properties of piezoelectric ceramics Common terms and terms GE2414-81 Test methods for properties of piezoelectric ceramics Radial expansion and contraction vibration of discs and transverse length of strips 3 Terms and symbols
3. 1 The symbols, definitions and terms used in this standard conform to the provisions of CB 3389. 1 3. 2 Dynamic method
Method for measuring the strain of piezoelectric ceramic samples under spectral conditions. 4 Test method
4. 1 Test conditionsbzxZ.net
4. 1. 1. Normal atmospheric conditions
Temperature: 15 ~ 35 C
Degree of compliance: 45% ~ 75%
Atmospheric pressure + 86 ~ 106 kP.
4.1.2 Ambient temperature during testing
For samples of the same group of different materials, the change in the ambient temperature during the salt measurement process should be controlled within ± 2 °C. 4.2 Test samples
4.2.1 For static test samples, rectangular or cylindrical samples can be used. 4.2.2 For dynamic test samples:
B. According to different vibration modes, the samples are made into sizes that meet the requirements of GR 2414: b. Make the benzene sound frequency of the sample compatible with the frequency range of the vibration tester used. 4.3 Laser interference method
4.3.1 Principle of the method
The principle of laser interference is used to make the piezoelectric ceramic sample deform (displace) under the influence of an external electric field. The object light is modulated to change the interference fringes, thereby obtaining the deformation value of the measured object. 4 3.2 Test equipment
Approved by the State Administration of Technical Supervision on April 25, 1996 and implemented on January 1, 1997
GB/T 163041996
a. Adjustable high-voltage DC power supply, voltage range 5 kV, ripple coefficient not more than 1%; h, conventional test equipment for piezoelectric ceramic samples, in accordance with Article 4.2.3 of GB 2414, Michelson laser interferometer, resolution -1 (1-0.6328 pm), c
d Bessel laser interferometer, other vibrometers with sample accuracy, amplitude test range 0.002 (~0.378 0 μm, test accuracy ± (1 ~ 5)%, 4.3.3 Test procedure
4.3.3.1 Static test
4.3.3.1.1 Sample installation
One end of the sample to be tested is vertically glued to a rigid mass block, and then a small plane reflector is vertically glued to the center of the other end face (the diameter d of the small mirror is not more than 10 mtn, and the thickness t is about 1 mn). 4.3.3. 1. 2 Measurement
First, adjust the Michelson interferometer to normal working state, then connect the sample to the DC voltage source circuit, and adjust the voltage slowly according to the law of fringe integer change, increase the voltage, decrease the voltage, reverse increase the voltage, decrease the voltage, observe the movement of the interference fringes, and calculate the number of moving fringes N. Note: When the voltage returns to zero, there may be residual fringing effect (i.e. residual deformation). 4.3.3.1.3 Calculation of strain
According to the change of the number of fringes N, calculate the corresponding deformation and strain according to formula (1) and formula (2). NN.
The deformation amount produced by the test partner under a certain electric beam, m1; In the formula -
NThe number of moving fringes read under a certain voltage; -Laser wavelength (=0.6328μm);
The corresponding strain when the test partner produces deformation> under a certain voltage Variable; 1 Length of the tested side, mm.
4.3.3.2 Dynamic method test
4.3.3.2.1 Install the sample
Firmly install the sample in a special test fixture, and clamp it at the center point (node) of the sample. Glue a small area of ​​total reflection mirror on the tested end face of the sample (the diameter of the small mirror is not more than 5mm, and the precision is about 1mm). 4.3.3.2.2 Adjust the high-frequency laser cross-sectional vibrometer. Place the sample on the clamp in the measuring optical path of the vibrometer, adjust the optical path and other necessary instruments to make them in normal working condition:
4.3.3.2.3 Measurement
Start the measurement after the vibration to be measured is stable. According to the different vibrations invited, when it is greater than or equal to 0.03m1, the method + less than 0.03 μm, the maximum value method can be used. The excitation electric field signal and amplitude of the sample J: must meet the requirements of GB 2414. Each measurement must be carried out quickly.
4.4 Measuring static deformation by inductance method
Measuring static deformation by inductance method is shown in Appendix A (Supplement). 4.5 Measuring static deformation by capacitance method
Measuring static deformation by capacitance method is shown in Appendix B (Supplement). 4.6 Calculation and evaluation of test results
GB/T16304-1996
4. 6.1 Draw a curve of the relationship between the static strain S of the sample under test and the external vertical electric field Ex:. 4-6. 2
Draw a curve of the relationship between the amplitude A, and the excitation voltage Vαc in the resonant state (fundamental frequency). The results can also be displayed in a table.
A1 Test material
According to 4.1.1,
A2 Method principle summary
GB/T163041996
Appendix A
Measuring static deformation of piezoelectric ceramics
(Supplement)
Use an inductive micrometer to contact the object to be measured. When the object to be measured is deformed, the inductance in the micrometer probe will change by 1., thereby achieving the purpose of measuring deformation.
A3 Test sample
According to the requirements of 1.2.1.
A4 Test instrument, equipment and requirements
Inductor micrometer
Current and voltage source
A5 Test procedure
Test range: 0~±100μm resolution 0.1jutml voltage detection range, 0~10 kV, accuracy ±5%.
Place the test sample on the test bench, adjust the position of the probe so that it contacts the surface of the test sample, and then perform deformation measurement after zeroing.
Slowly and continuously adjust the DC voltage, increase and decrease; reverse increase and decrease, record the deformation sense under the corresponding voltage value, and thus complete a cycle measurement.
A6 Calculation of strain
For any direction of the measured object, the corresponding deformation value V generated by any voltage can be directly measured by the electric micrometer. The strain value under the action of constant voltage can be calculated by the test (2). A7 Calculation and evaluation of test results
According to the provisions of 6.1.6.3. Appendix B
Measurement of the state deformation of piezoelectric ceramics by capacitance method (supplementary)
B1 Test conditions
According to 4.1.1.
B2 Principle of the method
Use an electric micrometer to make the measured object and the micrometer form a capacitor plate. When the measured object is deformed, the distance between the two plates will change, thereby achieving the purpose of measuring deformation. B3 test sample
press 4. 2.1 requirement.
B4 Test instruments, equipment and requirements
Capacitive micrometer
DC voltage source
B5 Test procedure
Measurement range: 0±50μm, resolution 0.1μm, voltage range: 0-~10 kV, accuracy ±5%. Fix the sample to be tested on the test bench, adjust the distance between the probe of the capacitive micrometer and the surface of the sample to be tested so that it is within the effective measurement range of the micrometer, fix the probe, and adjust the micrometer to zero before the deformation measurement can be carried out. Slowly and continuously adjust the voltage, increase, decrease; reverse increase, decrease, record the deformation at the corresponding voltage level, which completes a cycle measurement.
Calculation of strain
For any direction of the sample under test, the corresponding deformation value △work produced by the voltage can be directly measured by a capacitance micrometer, and the strain value under different voltages can be calculated by formula (2). B7 Calculation and evaluation of test results
According to the provisions of Articles 4.6.1 and 4.6.3. Additional remarks:
This standard was proposed by China State Shipbuilding Corporation. The 715th Institute of China State Shipbuilding Corporation was responsible for drafting this standard, and the 721st Factory, 726th Institute, Lu Xue Institute of the Chinese Academy of Sciences, Tianjin University, and the 26th Institute of the Ministry of Electronics participated in the drafting.
The main drafter of this standard is Yu Suolong.
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