GB/T 4589.1-1989 General specification for discrete semiconductor devices and integrated circuits (for certification purposes)

GB/T 4589.1-1989 Semiconductor Devices, Discrete Devices and Integrated Circuits, General Specification (for certification) GB/T4589.1-1989 Standard download decompression password: www.bzxz.net

1 Scope
National Standard of the People's Republic of China
Semiconductor devices
Generit specificatlon for
discrete devices and integrated circuits
Semiconductor devices
Generit specificatlon for
discrete devices and integrated circuits (for certification)
This standard forms part of the International Electrotechnical Commission's system for quality assessment of electrical components (IECQ). CB 4589. 1-89
IEC 747-10
IECQ QC 700000
This standard is the general specification for semiconductor devices (discrete devices and integrated circuits, including customer chip integrated circuits, but excluding hybrid circuits). This standard specifies the general procedures for quality assessment adopted within the IECQ system and gives the general principles for the following aspects: Test methods for electrical characteristics
Climate mechanical tests:
Durability tests.
Note: When approved sectional specifications, class (or family) specifications and blank detail specifications exist for a specific device type or types, these specifications must be used to supplement this standard.
2 General
2.1 Order of precedence
When conflicting requirements arise, the various documents shall be arranged in the following order of authority: (1) Detailed specification;
Class (or family) specification (if any)
Blank detail specification;
Sub-specification,
(5) General specification;
Basic specification +
IECQ Rules of Procedure;
Other international documents, such as IEC documents, as may be referenced; (9)
National documents.
The same order of precedence applies to equivalent national documents. 2.2 Related documents The detailed specification shall indicate the applicable documents: IEC standards: IEC 27 Text symbols used in electrotechnical technology International Electrotechnical Vocabulary (IEV) Basic environmental test procedures Approved by the Ministry of Machinery and Electronics Industry of the People's Republic of China on March 18, 1989 Implementation on January 1, 1990 GB 4589.189 IEC 681 (1982) Part 1: General principles and guidelines IEC 68-2 Part 2: Tests or IEC 147, IEC 148: IEC 147 Basic ratings and characteristics of semiconductor devices and general principles of test methods IEC 147-0 (1966) Part 0: General principles and terminology and its supplements IEC 147-1 (1972)
Part 1: Basic ratings and characteristics
and its supplement
IEC 147-2 (1963)
and its supplement
Part 2, General principles of test methods
TEC 147-4 (1976)
Acceptance and reliability
IEC148 (1969) Text symbols for semiconductor devices and integrated circuits and its supplementbZxz.net
IEC 147-5 (1977)
and its supplement
Part 5: Mechanical and climatic test methods
or IEC 747.IEC 748.IEC 749: IEC747 Semiconductor devices Discrete devices and integrated circuits EC747-1 (1983) Part 1: General IEC748 Semiconductor devices Integrated circuits
IEC749 Mechanical and climatic test methods
IEC191 Mechanical standardization of semiconductor devices IEC 191-1 (1966)
Part 1, Drawings of semiconductor devices
and its supplement
IEC 191-2 (1966)
and its supplement
IEC 191-3 (1974)
and its supplement
Part 2: Dimensions
Part 3: General principles for the drawing of integrated circuit outlines EC 410 (1973)
Sampling plans and procedures for inspection by attributes
IEC617 Graphical symbols in drawings
1ECQ QC001002 (1981) IECQ Procedure Rules ISO Standards:
ISO 1000 (1973)
ISO 2015 (1976)
International units (S1) and recommended combinations of international units and numbering of other unit weeks
IS0 2859 (1974)
Sampling procedures and sampling tables for inspection by attributes
2.3 Units, symbols and terms
1S0 1000
IEC617
Any other unit symbols and terms specific to a semiconductor device implementing this general specification shall be taken from the relevant IEC or ISO standards (see Section 2.2) or derived based on the principles of the above standards. 2.4 Preferred values ​​of voltage, current and temperature Electrical characteristic tests, tests and working conditions For the preferred values ​​of voltage, current and temperature, see IEC Standard 747-1 and Standard 748-1. 2.5 Marking
a. On the device
GB 4589.189
When the area permits, the following markings should be marked on the device: (1) Terminal identification mark (see 2.5.1). (2) Model name (see 2.5.2), quality assessment category (see 2.6) and screening sequence when applicable (see 2.7). (3) Manufacturer's name, initials or trademark and factory identification code when applicable (see 2.5.3). (4) Inspection batch identification code (see 2.5.4). (5) If a certificate of conformity is not used, there should be a conformity mark. (6) Special precautions should be marked when applicable. When the area does not allow for full marking, the detailed specification shall give the minimum requirements in the order of priority given above. b. On the primary packaging
The following markings shall appear on the primary packaging used as the initial protection or packaging for delivery: (1) All markings listed in 2.5 a. except terminal markings. (2) Detailed specification number.
(3) Any special precautions, such as caution markings, etc. 2.5.1 Identification of terminals (refer to IEC 747.1, Chapter M, Clause 8) The identification of terminals shall be specified in the detailed specification with reference to the specified outline or base drawing. 2.5.2 Model name
When the model name is marked on the device, it is best to indicate it in letters and numbers, or by color code when specified in the detailed specification. The color code may be given in the sub-specification.
2.5.3 Manufacturer's name or trademark
If the manufacturer's name or trademark cannot be traced back to the manufacturer, the manufacturer's identification code shall be used. 2.5.4 Inspection lot identification code
The inspection lot identification code is represented by the week number specified in ISO 2015, followed by the last two digits of the year (e.g. 8345 for the 45th week of 1983). When the area available for marking on the device is limited and the detailed specification specifies otherwise, the first digit of the year may be omitted (e.g. 345 for the 45th week of 1983). This code is the date when the lot is submitted for inspection. When more than one batch of a certain model is submitted for inspection in the same week, the inspection batch identification (for example, using a "letter") can be used to distinguish the consecutive batches. 2.6 Quality Assessment Categories
This specification specifies three quality assessment categories. Devices in the same inspection batch with an inspection batch code shall be inspected according to the specified quality base category. The AQL or LTPD corresponding to the same inspection group may vary depending on the category and shall comply with the provisions of the detailed specification. The minimum requirements for each category are as follows:
Category - This category of devices meets the requirements for Class 1 or Class II identification and approval. All batches meet Group A inspection requirements including functional testing. Solderability inspection of a batch every three months shall meet the requirements. Group B and Group C inspections shall be conducted once a year and shall meet the requirements. Class I - Batches in this class meet the batch inspection requirements of Groups A and B and the periodic inspection requirements of Group C. Class - Batches in this class are subject to 100% screening and meet the batch inspection requirements of Groups A and B and the periodic inspection requirements of Group C. The sectional specification shall specify the minimum requirements for each class. The detailed specification may include supplementary requirements, including screening, that are not in the general specification, sectional specification or blank detailed specification.
2.7 Screening
Screening is an inspection or test applied to all devices in a batch. When required by the detailed specification, all devices in the submitted batch shall be screened according to one of the sequences given in the relevant table of the sub-specification, and all defective devices shall be eliminated. Other sequences specified in the specification shall be adopted only when the above sequence is irrelevant or inconsistent with the recognized ignition mechanism. When part of the screening procedure specified in the relevant table of the sub-specification forms part of the manufacturing process in the prescribed order, these procedures do not need to be repeated. For the purpose of this specification, aging is defined as the application of thermal and electrical stress to all devices in the batch for a specified time to detect and eliminate potential early failure devices. 3 Quality evaluation procedures
GB 4589.1—89
Quality assessment includes the procedure for obtaining the identification batch as specified in clause 3.5 and the subsequent batch-by-batch (including screening if required) and periodic quality consistency inspection as specified in the detailed specification. The quality assessment tests are divided into Group A, Group B and Group C tests (as specified in clause 2.6) carried out batch by batch or periodically. In some cases, Group D tests may also be specified, such as for the purpose of identification approval. 3.1 Qualification for identification approval
When Chapter 11 of the procedural rules of IECQQC001002 standard is obtained When the requirements are met, a device of a certain type is eligible for qualification approval.
3.1.1 Initial manufacturing stage
The initial manufacturing stage is specified in the sectional specification. 3.2 Commercial confidential information
If part of the manufacturing process is commercially confidential, it should be appropriately marked and the chief inspector should prove that the requirements of clause 10.2.2 of the "Procedure Rules" of IECQQC001002 have been followed to the satisfaction of the National Supervision and Inspection Agency (NSI). 3.3 Composition of the inspection and sorting
See 12.2 of the "Procedure Rules" of IECQQC001002. 3.4 Similar structural devices
See 8.5.3 of the "Procedure Rules" of IECQQC001002. Details of the grouping are given in the relevant sub-specifications. 3.5 Granting of certification approval
See 11.3.1 of the "Procedure Rules" of IECQQC001002. The manufacturer may choose method a) or method b) of 11.3.1 of the "Procedure Rules" according to the inspection requirements set out in the sub-specifications. Samples may be It is composed of appropriate structurally similar devices. In some cases, detailed testing is required for qualification approval. All variation tests required as a result of the experiments in the detailed specification shall be performed and the variation data shall be recorded. The qualification report shall include a summary of all test results conducted for each group and subgroup, including the number of tested devices and the number of effective devices, based on the variation and (or) count data. The manufacturer shall retain all data for use when requested by the NSI. 3.6 Quality consistency inspection
The quality consistency inspection shall be conducted by Group A, Group B, and Group C. The inspection and testing of Group A and Group B, when specified, shall consist of Group D inspections and tests. For Group B and Group C inspections, the samples may consist of structurally similar devices. Samples for periodic inspections shall be drawn from one or more lots. These lots shall also pass Group A and Group B inspections. Individual devices shall pass Group A tests as required by the detailed specification.
3.6.1 Division of Groups and Subgroups
The following guidelines shall be followed in the preparation of detailed specifications. 3.6.1.1 Group A Inspection (Batch by Batch)
This group specifies visual inspections and tests to assess the major characteristics of the devices, performed batch by batch. Unless otherwise specified, structurally similar groupings are not permitted. Group A inspections are divided into the following subgroups:
Group A1: This subgroup consists of the external monthly inspections specified in 4.2.1.1. Group A2: This subgroup consists of tests on the major characteristics of the devices. Groups A3 and A4: These subgroups are not required. They consist of tests on minor characteristics of the devices. The appropriate requirements for each device category are given in the relevant sectional specifications. Whether the test items are included in the A3 or A4 group depends essentially on the quality level at which these tests need to be performed.
GB 4589.1-89
3.6.1.2 Group B inspection [rate batch, except for Class 1 (see 2.6) This group specifies the procedures to be adopted to evaluate certain other characteristics of the device, including mechanical, climatic and electrical durability tests that can normally be completed within one week.
3.6.1.3 Group C Inspection (Periodic)
This group specifies the procedures to be followed for the periodic evaluation of certain other characteristics of the device, including electrical tests, mechanical, climatic and electrical endurance tests suitable for inspection at intervals of three months (Class I and Class II) or one year (Class I), or as specified in the relevant specifications. 3.6.1.4 Division of Groups B and C
In order to enable comparison and, when necessary (see 3.6.3), to facilitate the change from Group B to Group C and vice versa, the corresponding tests in Groups B and C are included in groups with the same number.
The division is as follows:
Group B1/C1 includes measurements of dimensions controlling the interchangeability of devices. Group B2a/C2a includes tests of electrical performance evaluating design features of the device. Group B2b/C2b includes tests to further evaluate certain electrical characteristics of the device tested in Group A at different voltages, currents or temperatures.
Group B2c/C2c: Includes verification of device ratings when applicable. Group B3/C3: Includes tests to assess the mechanical strength of device leads. For example, bolt torque, lead bending, etc. Group B4/C4: Includes tests to assess device soldering performance, Group B5/C5: Includes tests to assess the ability of devices to withstand climatic stress. For example, temperature change, sealing, etc. Group B6/C6: Includes tests to assess the ability of devices to withstand mechanical stress. For example, constant acceleration test, Group B7/7: Includes tests to assess the ability of devices to withstand long-term mixed heat. Group B8/C8: Includes tests to assess the failure characteristics of devices under durability test conditions. Group B9/C9: Includes tests to assess the electrical performance of devices under extreme temperature storage conditions. Group B10/C10: Includes tests to assess the performance of devices under changes in air pressure. Group B11/C11: Includes standard durability tests. CRRL Group: Select and list some of the tests and/or tests that have been performed in the above groups, and give their results in the Release Record (CRRE).
These groups may not all be required.
3.6.1.5 JD Group Inspection
This group specifies the procedures to be performed every twelve months or for qualification approval only. 3.6.2 Inspection Requirements
The statistical sampling procedures described in Section 3.7 should be used. 3.6.2.1 Batch Rejection Criteria
Batches that do not meet the quality consistency inspection of Group A or Group B shall not be accepted. If the device fails to pass a test in a group during the quality consistency inspection, the batch will be rejected, the quality consistency inspection can be terminated, and the batch will be regarded as a rejected batch of Group A or Group B. If an inspection batch does not meet the quality consistency requirements and is not resubmitted, it should be considered a rejected batch. 3.6.2.2 Resubmitted Lots
When technically possible, failed lots that are reworked and resubmitted for quality conformance testing shall contain only those devices that were in the original lot and each test group (Group A and Group B) shall be resubmitted only once. The resubmitted lots shall be separated from the new batch and clearly marked as resubmitted lots. Resubmitted lots shall be randomly resampled using a tightened inspection method and all failed groups shall be inspected. Resubmission of failed groups shall include Group A inspection. 3.6.2.3 Procedure in the event of test equipment failure or operator error If it is believed that the failure of a device is caused by test equipment failure or operator error, the failure shall be recorded in the test record (but not in the CRRL with the consent of NSI) and submitted to NSI together with a complete explanation of why it is determined that it is not a failure. The Chief Inspector shall decide whether to add replacement devices from the same test lot to the sample. The replacement device shall be subjected to the same tests to which the scrapped device was subjected before failure, and to the tests to which the scrapped device was subjected as specified but which had not been subjected before failure. 3.6.2.4 Sequence of failure of periodic inspection When Group B fails, the corresponding Group C inspection (see 3.6.1.4) is invalid. If the failure of periodic inspection is not caused by equipment failure or operator error, then: 12.6 of the "Procedure Rules" of IEC QQC001002 standard shall be implemented, and the following modifications shall be made: 12.6.1 Item a: \Suspend the release of all exposed parts in the structurally similar combination within this system. 12.6.4 Item a: After the manufacturing error is corrected, the release procedure within this system shall be immediately resumed for each batch of products that have been corrected. 12.6, Item "If the appraisal approval is in accordance with 12.6 of the "Procedure Rules".7, a simplified procedure (mainly for the test of those characteristics that cause failure) may be adopted according to the opinion of NSI to restore the appraisal approval". 3.6.3 Additional procedure for relaxed inspection
3.6.3 1 Group B
A special relaxed inspection procedure may be adopted to allow the manufacturer to inspect all groups of Group B inspection every three batches at a maximum interval of three months instead of avoiding the normal inspection of Group B. When a group meets the required conditions, this special procedure applies to the group. The condition for this change is that ten consecutive batches pass the Group B inspection. Under the relaxed inspection procedure, when a group of samples does not meet the inspection round of a group, the group should be restored to the normal inspection of Group B. 3.6.3.2 C When the interval between periodic tests is specified as three months, the test period may be extended to six months if three consecutive periodic tests are passed at three-month intervals. Under the extended interval procedure, when a group of samples fails a group test, the normal three-month interval shall be restored (see also 3.6.2.4). 3.6.4 Small batch sampling requirements
When the batch is less than or equal to 200, the following procedures shall be used in accordance with the appropriate requirements of Appendix A (when the AQI scheme is specified, the equivalent LTPD value shall be selected first from Table A3 of Appendix A). %, Non-destructive testing
(1) 100% of the devices shall be tested as indicated as non-circular, or: 1TPD·sampling plan applicable in Table A2 of Appendix A. Or: (2)
Applicable LPD) secondary shaft sampling plan.
h. Destructive testing
According to the applicable LTPD in Table A2 of Appendix A. Single sampling plan. Or: (2) Applicable LTPD secondary sampling plan. 3.6.5 Release batch certification record (CRRL)
See Chapter 14 of "Standard Procedure Rules No. 1FQQC001002". 3.6.6 Delivery of devices subjected to destructive or non-destructive tests Tests marked with (D) in the blank detailed specification are considered to be destructive. Devices that have undergone destructive tests shall not be included in the delivery batch. Devices that have undergone non-destructive environmental tests may be delivered as long as they are re-inspected according to Group A requirements and meet the requirements. 3.6.7 Delayed delivery
Batches stored for more than two years before delivery·The entire batch or to be delivered The parts of the batch shall be subjected to the specified Group A inspection and Group B solderability test. After such inspection and testing have been completed for the entire batch, no retesting is required for the next two years. 3.6.8 Additional delivery procedures
The manufacturer may provide devices with a more stringent assessment level than the specified level in place of devices with a less stringent assessment level. 3.7 Statistical sampling procedures
For Group A inspection, the AQL sampling procedure (according to IEC 410 and ISO 2859) or the LTPD sampling procedure (according to Annex A) may be used. The detailed specification shall specify which procedure is to be used; the AQL value (and inspection level) and LTPD value shall be given in the sectional specification.
GB4589.1-89
For other group inspections, the LTPD procedure shall be used. All tests in any group or sub-group shall be generally assessed according to one AQI. (and inspection level) or one LTPD. 3.7.1 AQL Sampling Plans
There are three types of sampling plans: single, double and multiple. When several types of sampling plans are applicable to a given AQL and code letter, any type may be used (see 3.5 of IEC 410). 3.7.2 The lot tolerance rate of nonconforming products (LTPD) sampling plan is shown in Appendix A.
3.7.3 Relationship between AQL sampling plan and LTPD sampling plan To ensure the correspondence between AQL and LTFD sampling plans, the maximum number of qualified decisions for group A inspection shall not be less than 4 (see Table A3 of Appendix A).
3.8 Durability test when 1.TPD is specified
When LTPD is specified, the acceptance procedure shall be as specified in A2 of Appendix A. In case of nonconformity, the procedures of A3 or A4 of Appendix A may be used.
If the batch still fails at the end, the procedure of 3.6.2.4 shall be applied. 3.9 Endurance test with specified peak efficiency (A) The failure rate used in this specification is defined as LTPD expressed as a percentage per 1000 h. NOTE: The maximum permissible failure rate of the endurance test should not be used to predict feasibility under normal operating conditions. Under normal operating conditions, the stress band applied to the device is much lower than that during the endurance test (with an accelerated effect). At the same time, the failure rate of the device in the early stage of life (for example, in the first 1000 h of operation) is often much higher than that later.
3.9.1 General
When the detail specification specifies ^ as the criterion, the endurance test with a test time of 1000 h shall be carried out according to the described procedure. Endurance tests completed on devices at the maximum rated values ​​or within the rated values ​​shall be considered non-destructive. 3.9.2 Sampling
The samples for the durability test shall be randomly drawn from the inspection lot (see Appendix A). The sample trays for the 1000 h test shall be selected by the manufacturer from the specified failure rate column (Table A1) or the actual batch column (Table A2) in Table A1 or Table A2 (see Appendix A). The number of qualified decisions shall correspond to the specific sample size selected. 3.9.3 Failure
A device that fails to meet one or more of the endpoint limits specified for the durability test at any specified read time shall be considered a failure and shall also be considered a failure at any subsequent read time. If a group of samples no longer meets the requirements of the durability test, the manufacturer may stop the test at his own discretion.
3.9.4 Durability Test Time and Sample Size
Whenever a failure rate is specified, the initial durability test time shall be 1000 h. Once the 1000h test has been passed, a durability test of at least 340h may be started for a new test conducted no more than 120 days after the 1000h durability test. The detailed specification may allow a test time of up to 2000h. The sample size for durability tests with a test time other than 1000h shall be selected based on the inverse relationship between the test time and the sample size so that the total accumulated device hours (sample size × test hours) equals the number of device hours selected for the 1000h durability test. The qualified judgment number shall also be determined based on the sample size corresponding to the 1000h test. If the number of failures does not exceed the qualified judgment number at the end of the test period, the test is qualified.
3.9.5 Procedure to be used when the number of failures found exceeds the acceptance number If the number of failures found during the durability test exceeds the acceptance number, the manufacturer shall select one of the following options: (1) Perform the procedure in Section 3.6.2.4.
(2) Add additional samples in accordance with Section 3.9.5.1
(3) If the test time initially selected is less than 1000 h, extend the test time to 1000 h in accordance with Section 3.9.5.2. CB 4589. 1—89
After performing procedures (2) or (3), if the test fails, perform the procedure in Section 3.6.2.1. 3.9.5.1 Add additional samples
This option can only be used once for each submission. When this option is selected, the new total sample base (initial plus additional) shall be selected by the manufacturer from the specified failure rate (Table A1) or actual batch (Table A2) column of Table A1 or Table A2 (Appendix A). An additional amount sufficient to increase the sample to the newly selected total sample amount shall be drawn from the original batch. The new qualified judgment number shall correspond to the new total sample amount selected. The additional samples shall be subjected to the same durability test conditions and time as the initial samples. If the total number of non-conforming products found (initial plus additional) does not exceed the qualified judgment number corresponding to the total sample, the test is qualified: if the number of non-conforming products found exceeds the new qualified judgment number, the test is considered unqualified. 3.9.5-2 Extension of durability test time
If the durability test time adopted is shorter than 1000h, and the number of defective products found in the initial samples exceeds the qualified judgment number, the manufacturer may decide to extend the test time of the entire initial sample to 1000h without adding samples, and determine a new qualified judgment number based on Table A1 or Table A2 (Appendix A). The new qualified judgment number corresponds to the minimum sampling base in the specified column that is less than or equal to the test sample quantity. Devices that fail at the initial readout time should still be considered failed at the 1000h readout time. If the number of defective products found exceeds this qualified judgment number, the test is considered to have failed. 4 Test and test procedures
4.1 Standard operating conditions for electrical tests
Unless otherwise specified, all electrical tests shall be carried out under IEC:147.5 or IF:The test shall be carried out under the atmospheric conditions specified in Standard 1EC68-1. Ambient temperature: 25°C. Relative humidity: between 45% and 75% (see also 5.3.2 of Standard 1EC68-1). Atmospheric pressure: between 86 kPa and 106 kPa (860-1060 mbar). The manufacturer may also carry out the test at other temperatures, provided that the national supervisory inspection agency can be satisfied that the device will still comply with the detailed specification when tested at an ambient temperature of 25°C and a relative condensation between 48% and 52% (if relative humidity is important). 4.2 Physical inspection
4.2.1 Visual inspection
4.2.1.1 External visual inspection
Unless otherwise specified, the external visual inspection shall be carried out under factory normal lighting conditions and normal viewing conditions. The following items shall be checked for correctness;
(1) Marking and its clarity;
(2) Terminal identification;
(3) Appearance (mechanical defects).
4.2.1.2 Internal visual inspection
Specified in the sectional specification.
4.2.2 Dimensions
Should be inspected in accordance with the specified drawing size. Appendix B specifies the dimensions to be inspected in Groups B and C. 4.2.3 Marking durability
The marking shall be tested in accordance with Clause 2 of Chapter [ of IEC 147-5 or Clause 2 of Chapter N of IEC 749. 4.3 Electrical testing
4.3.1 General conditions and precautions
4.3.1.1 Alternative methods
The specified method or any other method that gives equivalent results may be used for testing, but in case of dispute, only the specified method shall be used.
Note: "Equivalent" means that the characteristic value determined by this method is also within the specified range when tested by the specified method GB 4589. 189
a. The electrical test methods shall be as specified in IEC147-2 or IEC747 and 748. These methods shall be used when necessary and specified in the detailed specification.
b. Electrical test methods not specified in IEC147.2 or IEC747 and 748 shall be specified in the detailed specification. 4.3.1.2 Test accuracy
The limits listed in the detailed specification are absolute. When determining the actual test limits, test errors should be taken into account. 4.3.1.3 General precautions
General care should be taken to minimize test errors and avoid damage to the device. The most important precautions are given in IEC147-2 or IEC747-1.
4.4 Environmental testing
The environmental test methods shall be in accordance with those specified in IEC 68-2 and IEC 147-5 or IEC 749. These methods shall be used when required and specified in the detail specification. They shall be indicated as "destructive" or "non-destructive" in accordance with 3.6.6. When a mandatory test sequence is required, it shall be specified in the sectional specification or in the blank detail specification. Environmental test methods not specified in IEC 682 or IEC 147-5 or IEC 749 shall be specified in the detail specification. For those test methods that require observation or application of external forces related to the orientation of the device, such orientation and direction of force shall be as specified in Annex C.
41 Overview
GB 4589. 1-89
Appendix A
Batch Percentage of Defectives (LTPD) Sampling Plan (Supplement)
The following procedures apply to all quality conformity requirements. A1.1 Sampling
Samples shall be randomly drawn from the inspection lot. In the case of continuous production, the manufacturer may draw samples in a regular periodic manner during production, provided that the lot complies with the lot composition requirements. A1.2 Failures
A failure of a sample in one or more tests of a subdivision shall be recorded as a failure. A2 Sampling Methods
Batch-by-batch inspection data (sample size and number of nonconforming items found) shall be accumulated in a single inspection lot to demonstrate compliance with the criteria for each subdivision. Periodic inspections are as per 3.6.
A2.1 Sample Size
The sample size for each subdivision shall be determined in accordance with Table A1 or Table A2 and shall comply with the specified LTPD. The manufacturer may choose a larger sample size than required, but the number of failures permitted shall not exceed the number of acceptance criteria in Table A1 or Table A2 corresponding to the selected sample size. In Table A2, the LTPD column used to determine the sample size shall be the batch column that is closest in number to the actual submitted batch. If the actual batch is between the two batches given in the table, the manufacturer may use any of the adjacent batch columns at his discretion. In Table A2, if there is no I.TP1) value in the applicable batch column that is equal to or less than the specified LTPD value, 100% inspection shall be used. In Table A2, the I.TPD value in the applicable batch column that is closest in number to the specified LTPD value shall be used to determine the sample size. A2.2 Acceptance Procedure
When first sampling, a pass number shall be selected and the corresponding number of devices shall be sampled and tested according to the specified LTPD (see Section 3.9.2). If the number of nonconforming items found in the first sample is less than or equal to the pre-selected pass number, the batch shall be accepted. If the number of nonconforming items found exceeds the pre-selected pass number, additional samples may be selected to bring the total sample into compliance with Section 3.9.2. Submit for each lot the Table A1 or Table A2 applicable to the first sampling of a given subdivision and to all subsequent sampling of the same lot and subdivision.
A3 Supplemental Samples
The manufacturer may add a supplemental sample to the initial sample, but only once for any subdivision, and the supplemental sample must be subjected to all tests for that subdivision. The total sample size (initial and supplemental) shall be determined by a new acceptance number selected from Table A1 or Table A2.
A4 Multiple Criteria
When a group of samples has more than one acceptance criterion, all samples in the subdivision shall correspond to all criteria in the subdivision. In Table A1, the acceptance number shall correspond to the largest sample size in the applicable LTPD column that is less than or equal to the sample size used. In Table A2, the acceptance number shall correspond to the LTPD value specified in the Batch column for the sample size used. A5 100% Inspection
At the manufacturer's option, 100% inspection of the lot is permitted for those subdivisions that are not considered "destructive". If you find that the batch of 100GB 4589.189
If the percentage of defective products exceeds the specified 1TPD value, the batch shall be considered to fail the group inspection. Batches tested on the basis of 100% inspection can only be resubmitted on the basis of 100% inspection and inspected according to the LTPD of the strict inspection. A6 Stricter inspection
Stricter inspection shall be carried out according to the LTPD in Table A1 or Table A2 that is more severe than the specified inspection standard. 89
(12)(6*2)(2')
(900)(80(1)(180)(62(0)(290)(680)(9)
(0 0)90)0)2)20(830)()9)1(08'0)
(t00)(200*0(2900)(600(t0)
(880*0) [(290*0)(220 '0)](511*0)(61*0)8976
(980*0)(90*0)(220*0)(801*0)
(81*0)
( F0*0)|(190'0)(290'0)(101'0)(21*0)66
(“0)
(89*0)||tt| |(98*0)
(\0)(\0)
(0)(*0)(*0)
(800)(000)(90058000)
(98 *0)
(920*0)(260*0(670*0)(20'0)(1*0)662
(810*0)(180*0)(10*0)(290 *0)(01*0)1899
(980)(60)
(*0)(\0)
(910)00)(10*0)(*)(0800)
(2 9*0)
(600*0)(6100)(80*0)(220*)(960*0)(900)
(81*0)
(9 'z)
(S9*0)
(“9)
(8'21)(0't2)
(“8)
(g'i)('61 )
(“[)
(9291)
(9'st)
(F0\0)(20*0)
(9*0)(82*0)
(80) (9*0)(9 0)
(200*0)(200 *0)(500'0)(200'0)(T0 *0)(80*0)
(80\)(80*0)
(I+3=+)
Tip: This standard content only shows part of the intercepted content of the complete standard. If you need the complete standard, please go to the top to download the complete standard document for free.