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SJ/T 11043-1996 Test method for high frequency dielectric loss and dielectric constant of electronic glass SJ/T11043-1996 Standard
SJ/T 11042-1996 Test method for the temperature (Tk-100) at which the volume resistivity of electronic glass is 100 MΩ·cm SJ/T1104
SJ/T 11063-1996 Tungsten heater SJ/T11063-1996 standard download decompression password: www.bzxz.net
SJ/T 11062-1996 Tungsten stranded wire SJ/T11062-1996 standard download decompression password: www.bzxz.net
SJ/T 11041-1996 Test method for impact strength of electronic glass SJ/T11041-1996 Standard download decompression password: www.b
SJ/T 11040-1996 Test method for high temperature viscosity of electronic glass SJ/T11040-1996 Standard download decompression pass
SJ/T 11039-1996 Test method for annealing point and strain point of electronic glass SJ/T11039-1996 Standard download decompressio
SJ/T 11038-1996 Test method for softening point of electronic glass SJ/T11038-1996 Standard download decompression password: www.b