GB/T 15136-1994 Basic principles of semiconductor integrated circuit quartz clock circuit test methods
time:
2024-08-09 00:45:52
- GB/T 15136-1994
- in force
Standard ID:
GB/T 15136-1994
Standard Name:
Basic principles of semiconductor integrated circuit quartz clock circuit test methods
Chinese Name:
半导体集成电路石英钟表电路测试方法的基本原理
Standard category:
National Standard (GB)
-
Date of Release:
1994-06-16 -
Date of Implementation:
1995-02-01
Standard ICS number:
Electronics>>31.200 Integrated Circuits, MicroelectronicsChina Standard Classification Number:
Electronic Components and Information Technology>>Microcircuits>>L56 Semiconductor Integrated Circuits
alternative situation:
void;
Release date:
1994-06-16Review date:
2004-10-14Drafting Organization:
Shanghai Radio Factory No. 19Focal point Organization:
National Semiconductor Device Standardization Technical CommitteePublishing Department:
State Bureau of Technical SupervisionCompetent Authority:
Ministry of Information Industry (Electronics)
Description (Translated English) / downloadSkip to download
Summary:
This standard specifies the basic principles of the test methods for the electrical parameters of semiconductor integrated circuit quartz watch circuits. This standard applies to the electrical parameter test of semiconductor integrated circuits for quartz watches with pointer and digital ordinary timing functions. GB/T 15136-1994 Basic principles of test methods for semiconductor integrated circuit quartz watch circuits GB/T15136-1994 Standard download decompression password: www.bzxz.net
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